SECONDARY ION MASS-SPECTROMETRY - TOOL FOR IDENTIFICATION OF MATRIX ISOLATED SPECIES

被引：22

作者：

JONKMAN, HT ^{[1
]}

MICHL, J ^{[1
]}

机构：

[1] UNIV UTAH,DEPT CHEM,SALT LAKE CITY,UT 84112

来源：

JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS | 1978年 / 17期

关键词：

D O I：

10.1039/c39780000751

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：751 / 752

页数：2

相关论文

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[2] BENNINGHOVEN A, 1976, CRITICAL REV SOLID S, P291
[3] Moskovits M., 1976, CRYOCHEMISTRY
[4] THEORETICAL AND EXPERIMENTAL ASPECTS OF SECONDARY ION MASS-SPECTROMETRY
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[J]. VACUUM, 1974, 24 (10) : 493 - 504
[5] USE OF SECONDARY ION MASS-SPECTROMETRY IN SURFACE ANALYSIS
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[J]. SURFACE SCIENCE, 1975, 47 (01) : 301 - 323