XPC - AN ONLINE EXPERT SYSTEM FOR STATISTICAL PROCESS-CONTROL

被引：22

作者：

PHAM, DT

OZTEMEL, E

机构：

[1] Intelligent Systems Research Laboratory, School of Electrical, Electronic and Systems Engineering, University of Wales, College of Cardiff, Cardiff, CF1 3YH

来源：

INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH | 1992年 / 30卷 / 12期

关键词：

D O I：

10.1080/00207549208948195

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The majority of available microcomputer packages for statistical process control (SPC) are off-line programs which present information regarding quality in the form of control charts. The user has to interpret the charts to infer process and product quality. This paper describes XPC, an on-line expert system for SPC. The system produces mean and range charts and interprets them automatically- XPC consists of five main modules. The first module ascertains process parameters and constructs the charts. The second module performs capability analysis to ensure that these control charts are compatible with the process specifications. The third module interprets on-line data, detects possible out-of-control situations and suggests corrective actions. The fourth module updates the charts to improve process capability. The last module produces periodical reports. XPC is based on Leonardo, an expert system shell with a hybrid knowledge representation facility enabling the use of rules, rulesets, frames, procedures and classes

引用

页码：2857 / 2872

页数：16

共 19 条

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