LOCAL PROBING INSTRUMENTATION AT ADVANCED TECHNOLOGIES CENTER - SURFACE AND FORCE DEVICES WITH TUNNELING SENSOR

被引：4

作者：

MOISEEV, YN

PANOV, VI

SAVINOV, SV

PYAMINSKY, IV

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 03期

关键词：

D O I：

10.1116/1.587264

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Force and surface devices with tunneling sensor-scanning tunneling and atomic force microscopes-are constructed. Thermal drift, seismic and electronic noise are eliminated in precise experiments. The tunneling sensor is proved to be advantageous for large scale images and force versus distance measurements with high dynamic range and subnanometer resolution. The influence of adsorbate on scanning tunneling microscope (STM) images of graphite is demonstrated. The holes 2 nm in diameter are produced on graphite exposed at air using STM.

引用

页码：1690 / 1693

页数：4

共 12 条

[1] TUNNELING TRANSDUCERS - QUANTUM LIMITED DISPLACEMENT MONITORS AT THE NANOMETER SCALE [J].