RAMAN-SCATTERING AS A COMPOSITIONAL PROBE OF II-VI TERNARY SEMICONDUCTOR NANOCRYSTALS

被引：113

作者：

TU, A ^{[1
]}

PERSANS, PD ^{[1
]}

机构：

[1] RENSSELAER POLYTECH INST,CTR INTEGRATED ELECTR,TROY,NY 12180

来源：

APPLIED PHYSICS LETTERS | 1991年 / 58卷 / 14期

关键词：

D O I：

10.1063/1.105160

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We show how Raman optic-mode peak positions and relative intensities can be used in a straightforward way to determine crystallite composition in CdS(x)Se(1-x) nanocrystals embedded in glass. These Raman techniques are particularly useful for low-concentration or small-crystallite-size composites where x-ray diffraction is not a viable technique for structural characterization of crystallites.

引用

页码：1506 / 1508

页数：3

共 27 条

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