SCALING ON THE MOBILITY THRESHOLD IN ULTRA-THIN CESIUM FILMS

被引：1

作者：

ASTRAKHARCHIK, EG ^{[1
]}

机构：

[1] KAPITZA PHYS PROBLEMS INST,MOSCOW 142092,RUSSIA

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1993年 / 5卷 / 32期

关键词：

D O I：

10.1088/0953-8984/5/32/020

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The dependence of resistance upon thickness and temperature has been calculated for a thin continuous metal film. For a thickness near that of a monolayer, quantum corrections to conductivity are of the order of the classical conductivity itself, making a film behave like a semiconductor. Computed dependences have a striking resemblance to experimental data obtained on quench-condensed alkali metal films.

引用

页码：5929 / 5932

页数：4

共 6 条

[1] SCALING THEORY OF LOCALIZATION - ABSENCE OF QUANTUM DIFFUSION IN 2 DIMENSIONS [J].

ABRAHAMS, E ;

ANDERSON, PW ;

LICCIARDELLO, DC ;

RAMAKRISHNAN, TV .

PHYSICAL REVIEW LETTERS, 1979, 42 (10) :673-676

[2]

Astrakharchik E. G., 1990, Soviet Physics - JETP, V71, P1190

[3]

Astrakharchik E. G., 1988, Soviet Physics - JETP, V67, P981

[4]

ASTRAKHARCHIK EG, 1977, SOV PHYS JETP, V45

[5]

ZAVARITSKAYA EI, 1985, SOV PHYS JETP, V41, P393

[6]

ZAVARITSKAYA TN, 1987, JETP LETT+, V45, P609

← 1 →