BRAGG ANGLE MEASUREMENT AND MAPPING

被引：60

作者：

HART, M

机构：

来源：

JOURNAL OF CRYSTAL GROWTH | 1981年 / 55卷 / 02期

关键词：

D O I：

10.1016/0022-0248(81)90046-4

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：409 / 427

页数：19

共 94 条

[1] SIMPLE BRAGG-SPACING COMPARATOR [J].

ANDO, M ;

BAILEY, D ;

HART, M .

ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 (JUL) :484-489

[2]

AZAROFF LV, 1974, XRAY SPECTROSCOPY

[3] EFFECT OF CARBON ON LATTICE PARAMETER OF SILICON [J].

BAKER, JA ;

TUCKER, TN ;

MOYER, NE ;

BUSCHERT, RC .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (09) :4365-&

[4] ABSOLUTE MEASUREMENT OF LATTICE-PARAMETER OF GERMANIUM USING MULTIPLE-BEAM X-RAY-DIFFRACTOMETRY [J].

BAKER, JFC ;

HART, M .

ACTA CRYSTALLOGRAPHICA SECTION A, 1975, A 31 (MAY1) :364-367

[5] PRECISE LATTICE-PARAMETER DETERMINATION OF DISLOCATION-FREE GALLIUM-ARSENIDE .1. X-RAY MEASUREMENTS [J].

BAKER, JFC ;

HART, M ;

HALLIWELL, MAG ;

HECKINGBOTTOM, R .

SOLID-STATE ELECTRONICS, 1976, 19 (04) :331-&

[6]

BAKER JFC, 1973, THESIS U BRISTOL

[7] VERY HIGH PRECISION X-RAY DIFFRACTION [J].

BAKER, TW ;

GEORGE, JD ;

BELLAMY, BA ;

CAUSER, R .

NATURE, 1966, 210 (5037) :720-&

[8]

BAKER TW, 1968, ADV XRAY ANAL

[9]

BAKER TW, 1969, AERE R5152 REP

[10] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J].

BATTERMAN, BW ;

COLE, H .

REVIEWS OF MODERN PHYSICS, 1964, 36 (03) :681-&

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