LOW TEMPERATURE ELECTRICAL RESISTIVITY MEASUREMENTS ON REACTIVE SAMPLES

被引:4
作者
PACK, JG
LIBOWITZ, GG
机构
关键词
D O I
10.1063/1.1683962
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
An apparatus and a technique for measuring electrical resistivities on reactive samples are described. Measurements were made in an inert atmosphere vacuum glove box containing a high purity helium environment. A precision micromanipulator was used to position a four point probe while observation was made through a microscope to guide the positioning of the probe. A cold stage permitted measurements to be made from room to liquid nitrogen temperature. This method was used to measure the electrical resistivities of cerium hydride single crystals. © 1969 The American Institute of Physics.
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页码:420 / &
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