IDENTIFICATION AND MEASUREMENT OF PHASES IN MNBI THIN FILMS USING AN X-RAY DIFFRACTOMETRIC TECHNIQUE

被引:4
作者
LIU, TS
KNUDSON, CI
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1971年 / 5卷 / 02期
关键词
D O I
10.1002/pssa.2210050231
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
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页码:K91 / &
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