CH4/H2 - A UNIVERSAL REACTIVE ION ETCH FOR II-VI SEMICONDUCTORS

被引:39
作者
FOAD, MA [1 ]
WILKINSON, CDW [1 ]
DUNSCOMB, C [1 ]
WILLIAMS, RH [1 ]
机构
[1] UNIV WALES COLL CARDIFF,DEPT PHYS & ASTRON,CARDIFF CF1 3TH,WALES
关键词
D O I
10.1063/1.106929
中图分类号
O59 [应用物理学];
学科分类号
摘要
A high resolution reactive ion etching process, capable of producing nanostructures less than 50 nm wide in a variety of II-VI semiconductors, is described. Using a mixture of methane and hydrogen, binary II-VI compound, e.g., ZnTe, ZnSe, CdTe, ZnS, CdS, and ternary compounds, e.g., CdMnTe and ZnSSe, have been etched. It would appear that the CH4/H2 gas mixture will play the same role for the II-VI semiconductors as it does for the III-Vs, that of seemingly ubiquitous etching system.
引用
收藏
页码:2531 / 2533
页数:3
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