X-RAY-MICROANALYSIS NEAR AN ABSORPTION-EDGE USING SYNCHROTRON RADIATION - HOW TO OBTAIN QUANTITATIVE RESULTS

被引：8

作者：

BIGLER, E

POLACK, F

LOWENTHAL, S

机构：

来源：

OPTICS COMMUNICATIONS | 1982年 / 41卷 / 01期

关键词：

D O I：

10.1016/0030-4018(82)90201-2

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：6 / 12

页数：7

共 23 条

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