X-RAY-DIFFRACTION STUDY OF AMORPHOUS AL77.5MN22.5 AND AL56SI30MN14 ALLOYS

The structure of amorphous sputtered Al//7//7//. //5Mn//2//2//. //5 and as-spun Al//5//6Si//3//0Mn//1//4 alloys was investigated by X-ray diffraction. Some features observed in the intensity profile are a pronounced prepeak at Q equals 16 nm** minus **1 in both the alloys and a shoulder at the low Q side in Al-Si-Mn. In the radial distribution functions, the first peak has a shoulder at the high r side. This experimental evidence suggests the presence of a chemical short range order persisting in the alpha phase.