SI/SIGE EPITAXIAL-BASE TRANSISTORS .1. MATERIALS, PHYSICS, AND CIRCUITS

被引:273
作者
HARAME, DL
COMFORT, JH
CRESSLER, JD
CRABBE, EF
SUN, JYC
MEYERSON, BS
TICE, T
机构
[1] MICROELECTR SCI & TECHNOL CTR,HOPEWELL JCT,NY 12533
[2] AUBURN UNIV,ALABAMA MICROELECTR SCI & TECHNOL CTR,DEPT ELECT ENGN,AUBURN,AL 36849
[3] ANALOG DEVICES INC,GREENSBORO,NC 27409
关键词
D O I
10.1109/16.368039
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A detailed review of SiGe epitaxial base technology is presented, which chronicles the progression of research from materials deposition through device and integration demonstrations, culminating in the first SiGe integrated circuit application, In part I of this paper, the requirements and processes for high-quality SiGe film preparation are discussed, with emphasis on fundamental principles, A detailed overview of SiGe HBT device design and implications for circuit applications is then presented, In part II, process integration concerns are described, first in general terms, followed by an extensive review of simple, nonself-aligned device structures, and lastly, a review of more complex self-aligned structures, The extension of SiGe device technology to high levels of integration is then discussed through detailed review of a fun SiGe-HBT BiCMOS process, Finally, the successful fabrication of a 12-bit Digital-to-Analog Converter is presented to highlight the application of SiGe technology.
引用
收藏
页码:455 / 468
页数:14
相关论文
共 40 条
[1]  
BLOEM J, 1985, VLSI ELECTRONICS MIC, V12, P89
[2]  
Burghartz J. N., 1990, International Electron Devices Meeting 1990. Technical Digest (Cat. No.90CH2865-4), P297, DOI 10.1109/IEDM.1990.237171
[3]  
CHUANG CT, 1991, BCTM, P142
[4]  
Comfort J. H., 1990, International Electron Devices Meeting 1990. Technical Digest (Cat. No.90CH2865-4), P21, DOI 10.1109/IEDM.1990.237235
[5]  
Comfort J. H., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P857, DOI 10.1109/IEDM.1991.235290
[6]  
COMFORT JH, 1990, DEV RES C JUN, P21
[7]  
Crabbe E. F., 1990, International Electron Devices Meeting 1990. Technical Digest (Cat. No.90CH2865-4), P463, DOI 10.1109/IEDM.1990.237067
[8]  
Crabbe E. F., 1993, International Electron Devices Meeting 1993. Technical Digest (Cat. No.93CH3361-3), P83, DOI 10.1109/IEDM.1993.347393
[9]   HIGH-LOW POLYSILICON-EMITTER SIGE-BASE BIPOLAR-TRANSISTORS [J].
CRABBE, EF ;
COMFORT, JH ;
CRESSLER, JD ;
SUN, JYC ;
STORK, JMC .
IEEE ELECTRON DEVICE LETTERS, 1993, 14 (10) :478-480
[10]   CURRENT GAIN ROLLOFF IN GRADED-BASE SIGE HETEROJUNCTION BIPOLAR-TRANSISTORS [J].
CRABBE, EF ;
CRESSLER, JD ;
PATTON, GL ;
STORK, JMC ;
COMFORT, JH ;
SUN, JYC .
IEEE ELECTRON DEVICE LETTERS, 1993, 14 (04) :193-195