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ACOUSTIC MICROSCOPY - 1979

被引：54
作者：
KESSLER, LW
YUHAS, DE
机构：
[1] Sonoscan, Inc., Bensenville
来源：
PROCEEDINGS OF THE IEEE | 1979年 / 67卷 / 04期
关键词：
D O I：
10.1109/PROC.1979.11281
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Acoustic microscopy is emerging as an important analytical technique serving the needs of both biomedical and materials technology. Based upon imaging of specimens with elastic waves at VHF and UHF frequencies, acoustic microscopes reveal structural-mechanical properties with high magnification. A review of the techniques and their applications are presented. Copyright © 1979 by The Institute of Electrical and Electronics Engineers, Inc.
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页码：526 / 536
页数：11
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