AN ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE WITH INTERCHANGEABLE SAMPLES AND TIPS

被引：51

作者：

CHIANG, S

WILSON, RJ

GERBER, C

HALLMARK, VM

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1988年 / 6卷 / 02期

关键词：

D O I：

10.1116/1.575423

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：386 / 389

页数：4

共 17 条

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[3]

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[8] OBSERVATION OF ATOMIC CORRUGATION ON AU(111) BY SCANNING TUNNELING MICROSCOPY [J].

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[9] SCANNING TUNNELING MICROSCOPY STUDY OF METALS - SPECTROSCOPY AND TOPOGRAPHY [J].

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[10]

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