THE ROLE OF DISORDER IN MAXIMIZING THE UPPER CRITICAL-FIELD IN THE NB-SN SYSTEM

被引:42
作者
ORLANDO, TP [1 ]
ALEXANDER, JA [1 ]
BENDING, SJ [1 ]
KWO, J [1 ]
POON, SJ [1 ]
HAMMOND, RH [1 ]
BEASLEY, MR [1 ]
MCNIFF, EJ [1 ]
FONER, S [1 ]
机构
[1] MIT,FRANCIS BITTER NATL MAGNET LAB,CAMBRIDGE,MA 02139
关键词
D O I
10.1109/TMAG.1981.1061041
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:368 / 369
页数:2
相关论文
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