RANDOM ERRORS IN MOS CAPACITORS

[1] KAHN H, 1960, MATH METHODS DIGITAL

[2] KRUMMENACHER F, 1980, AGEN MITTEILUNGE AUG, P41

[3] MCCREARY J, COMMUNICATION

[4] MATCHING PROPERTIES, AND VOLTAGE AND TEMPERATURE-DEPENDENCE OF MOS CAPACITORS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1981, 16 (06) : 608 - 616

[5] MCCREARY JL, 1975, THESIS U CALIFORNIA

[6] Papoulis A., 1984, PROBABILITY RANDOM V

[7] Sobol I., 1974, MONTE CARLO METHOD

[8] 2-STAGE WEIGHTED CAPACITOR NETWORK FOR D-A-A-D CONVERSION [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (04) : 778 - 781

[1] KAHN H, 1960, MATH METHODS DIGITAL

[2] KRUMMENACHER F, 1980, AGEN MITTEILUNGE AUG, P41

[3] MCCREARY J, COMMUNICATION

[4] MATCHING PROPERTIES, AND VOLTAGE AND TEMPERATURE-DEPENDENCE OF MOS CAPACITORS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1981, 16 (06) : 608 - 616

[5] MCCREARY JL, 1975, THESIS U CALIFORNIA

[6] Papoulis A., 1984, PROBABILITY RANDOM V

[7] Sobol I., 1974, MONTE CARLO METHOD

[8] 2-STAGE WEIGHTED CAPACITOR NETWORK FOR D-A-A-D CONVERSION [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (04) : 778 - 781