LARGE PURELY REFRACTIVE NONLINEAR INDEX OF SINGLE-CRYSTAL P-TOLUENE SULFONATE (PTS) AT 1600 NM

被引：102

作者：

LAWRENCE, BL

CHA, M

KANG, JU

TORUELLAS, W

STEGEMAN, G

BAKER, G

METH, J

ETEMAD, S

机构：

[1] MICHIGAN STATE UNIV,DEPT CHEM,E LANSING,MI 48824

[2] DUPONT CO INC,CENT RES & DEV,WILMINGTON,DE 19880

[3] BELL COMMUN RES INC,RED BANK,NJ 07701

来源：

ELECTRONICS LETTERS | 1994年 / 30卷 / 05期

关键词：

NONLINEAR OPTICS; REFRACTIVE INDEX MEASUREMENT;

D O I：

10.1049/el:19940285

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Z-scan measurements at 1600 nm on single-crystal PTS (p-toluene sulfonate) with single, 65 ps pulses gave a complex nonlinear refractive index coefficient of n2 = 2.2(+/-0.3) x 10(-12)cm2/W at 1 GW/cm2 and alpha2 < 0.5cm/GW. This is the first highly nonlinear, organic material to satisfy the conditions imposed by the figures of merit.

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页码：447 / 448

页数：2

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