X-RAY FLUX ENHANCEMENT IN THIN-FILM WAVE-GUIDES USING RESONANT BEAM COUPLERS

被引：137

作者：

FENG, YP ^{[1
]}

SINHA, SK ^{[1
]}

DECKMAN, HW ^{[1
]}

HASTINGS, JB ^{[1
]}

SIDDONS, DP ^{[1
]}

机构：

[1] BROOKHAVEN NATL LAB,NATL SYNCHROTRON LIGHT SOURCE,UPTON,NY 11973

来源：

PHYSICAL REVIEW LETTERS | 1993年 / 71卷 / 04期

关键词：

D O I：

10.1103/PhysRevLett.71.537

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We present experimental evidence for achieving significant x-ray flux enhancement by coupling a highly collimated and monochromatic synchrotron x-ray beam into a Si/polyimide/SiO2 thin-film waveguide. The observed 20-fold flux increase agrees with theoretical predictions and was limited only by absorption of the 1 angstrom x rays in the waveguide structure.

引用

页码：537 / 540

页数：4

共 8 条

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