HIGH-ACCURACY FOURIER TRANSFER FRINGE PATTERN-ANALYSIS

被引：65

作者：

KUJAWINSKA, M

WOJCIAK, J

机构：

[1] Institute of Design of Precise and Optical Instruments, Warsaw University of Technology, 02-525 Warsaw

来源：

OPTICS AND LASERS IN ENGINEERING | 1991年 / 14卷 / 4-5期

关键词：

D O I：

10.1016/0143-8166(91)90056-Y

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The principle of the Fourier transform method of fringe pattern analysis is described with emphasis on the refinements for high accuracy measurements. Characteristics of the main sources of errors of the retrieved phase in respect to the interferogram features and the modified software procedure are given. The quantitative results of the analysis of computer-generated and real interferograms are presented. The possibility of obtaining the overall accuracy of lambda/100 is proved.

引用

页码：325 / 339

页数：15

共 19 条

[1] FRINGE-PATTERN ANALYSIS USING A 2-D FOURIER-TRANSFORM [J].

BONE, DJ ;

BACHOR, HA ;

SANDEMAN, RJ .

APPLIED OPTICS, 1986, 25 (10) :1653-1660

[2]

CHOUDRY A, 1989, P SPIE, V1135, P113

[3]

CREATH K, 1988, PROGR OPTICS, P35

[4]

DEW GD, 1966, J SCI INSTRUM, V34, P4094

[5]

FRANKOWSKI G, 1989, P SPIE, V1122, P89

[6] INVESTIGATION OF THE FOURIER-TRANSFORM METHOD OF FRINGE PATTERN-ANALYSIS [J].

GREEN, RJ ;

WALKER, JG ;

ROBINSON, DW .

OPTICS AND LASERS IN ENGINEERING, 1988, 8 (01) :29-44

[7]

JOHNSON GW, 1977, P SOC PHOTO-OPT INS, V126, P152

[8] DIGITAL HOLOGRAPHIC INTERFERENCE-PHASE MEASUREMENT USING THE FOURIER-TRANSFORM METHOD [J].

KREIS, T .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1986, 3 (06) :847-855

[9]

Kujawinska M., 1989, P SOC PHOTO-OPT INS, V1121, P130

[10]

Kwon O. Y., 1985, P SPIE INT SOC OPT E, V599, P273

← 1 2 →