OPTICAL TECHNIQUES USEFUL FOR CHARACTERIZING GAP CRYSTALS

被引：8

作者：

BACHRACH, RZ ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ

来源：

JOURNAL OF ELECTRONIC MATERIALS | 1974年 / 3卷 / 03期

关键词：

D O I：

10.1007/BF02655292

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：645 / 691

页数：47

共 77 条

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BACHRACH, RZ ;

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[3] MEASUREMENT OF EXTRINSIC ROOM-TEMPERATURE MINORITY CARRIER LIFETIME IN GAP [J].

BACHRACH, RZ ;

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[5]

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[6]

BACHRACH RZ, TO BE PUBLISHED

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[8] LOCALIZED VIBRATIONAL MODES OF INTERSTITIAL OXYGEN AND OXYGEN COMPLEXES IN GAP [J].

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[9]

BASS SJ, 1968, J CRYST GROWTH, V2, P169

[10] DETERMINATION OF OPTICAL IONIZATION CROSS SECTIONS IN GAP USING CHARGE STORAGE AND IMPURITY PHOTOVOLTAIC EFFECT [J].

BJORKLUND, G ;

GRIMMEISS, HG .

SOLID-STATE ELECTRONICS, 1971, 14 (07) :589-+

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