DISLOCATION EMISSION FROM CRACKS - OBSERVATIONS BY X-RAY TOPOGRAPHY IN SILICON

被引：54

作者：

MICHOT, G ^{[1
]}

GEORGE, A ^{[1
]}

机构：

[1] UNIV PARIS 11,CNRS,LAB UTILISAT RAYONNEMENT ELECTROMAGNET,F-91405 ORSAY,FRANCE

来源：

SCRIPTA METALLURGICA | 1986年 / 20卷 / 11期

关键词：

D O I：

10.1016/0036-9748(86)90382-0

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：1495 / 1500

页数：6

共 42 条

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