RELIABILITY ANALYSIS TECHNIQUES

被引：2

作者：

KROHN, CA

机构：

来源：

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS | 1960年 / 48卷 / 02期

关键词：

D O I：

10.1109/JRPROC.1960.287462

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：179 / 192

页数：14

共 24 条

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[3]

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[4]

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EPSTEIN, B .

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[7] SEQUENTIAL LIFE TESTS IN THE EXPONENTIAL CASE [J].

EPSTEIN, B ;

SOBEL, M .

ANNALS OF MATHEMATICAL STATISTICS, 1955, 26 (01) :82-93

[8]

EPSTEIN B, 1953, J AM STATISTICAL ASS, V48, P585

[9]

FLEHINGER BJ, 1958 IRE NAT CONV 6, P137

[10]

HALD A, 1952, STATISTICAL THEORY E, P742