X-RAY SPECTROPHOTOGRAPHIC DETERMINATION OF TANTALUM, NIOBIUM, IRON, AND TITANIUM OXIDE MIXTURES - USING SIMPLE ARITHMETIC CORRECTIONS FOR INTERELEMENT EFFECTS

被引：22

作者：

MITCHELL, BJ

机构：

来源：

ANALYTICAL CHEMISTRY | 1958年 / 30卷 / 12期

关键词：

D O I：

10.1021/ac60144a002

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1894 / 1900

页数：7

共 12 条

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AXELROD, JM .

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[2] HAFNIUM-ZIRCONIUM AND TANTALUM-COLUMBIUM SYSTEMS - QUANTITATIVE ANALYSIS BY X-RAY FLUORESCENCE [J].

BIRKS, LS ;

BROOKS, EJ .

ANALYTICAL CHEMISTRY, 1950, 22 (08) :1017-1020

[3] ATTAINMENT OF HIGH RESOLUTION IN X-RAY FLUORESCENT ANALYSIS - SIMPLIFICATION OF X-RAY FLUORESCENT ANALYSIS PROCEDURES [J].

BRISSEY, RM .

ANALYTICAL CHEMISTRY, 1952, 24 (06) :1034-1035

[4] QUANTITATIVE ANALYSIS OF NIOBIUM AND TANTALUM IN ORES BY FLUORESCENT X-RAY SPECTROSCOPY [J].

CAMPBELL, WJ ;

CARL, HF .

ANALYTICAL CHEMISTRY, 1954, 26 (05) :800-805

[5] FLUORESCENT X-RAY SPECTROGRAPHIC DETERMINATION OF TANTALUM IN COMMERCIAL NIOBIUM OXIDES [J].

CAMPBELL, WJ ;

CARL, HF .

ANALYTICAL CHEMISTRY, 1956, 28 (06) :960-962

[6]

CARL HF, 1954, AM SOC TEST MATER, V157, P63

[7] X-RAY SPECTROGRAPHIC METHOD FOR THE DETERMINATION OF VANADIUM AND NICKEL IN RESIDUAL FUELS AND CHARGING STOCKS [J].

DAVIS, EN ;

HOECK, BC .

ANALYTICAL CHEMISTRY, 1955, 27 (12) :1880-1884

[8]

HASLER MF, 1955, 4TH ANN S IND APPL X

[9]

KEMP JW, 1956, FEB PITTSB C AN CHEM

[10]

MORTIMORE DM, 1954, APPL SPECTROSC, V8, P24

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