SWITCHING PROCESSES AND DIELECTRIC-BREAKDOWN IN NI0 AND NI0(LI) THIN-FILMS

被引:5
作者
LALEVIC, B [1 ]
FUSCHILLO, N [1 ]
LEUNG, B [1 ]
机构
[1] RUTGERS STATE UNIV, DEPT ELECT ENGN, NEW BRUNSWICK, NJ 08903 USA
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1974年 / 23卷 / 01期
关键词
D O I
10.1002/pssa.2210230106
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:61 / 67
页数:7
相关论文
共 16 条
[1]  
[Anonymous], 1968, SOLID STATE PHYS, DOI DOI 10.1016/S0081-1947(08)60741-9
[2]   SWITCHING PHENOMENA IN TITANIUM OXIDE THIN FILMS [J].
ARGALL, F .
SOLID-STATE ELECTRONICS, 1968, 11 (05) :535-&
[3]  
AUSTIN I, 1970, P S SEMICONDUCTOR EF, P474
[4]  
Debye P., 1929, POLAR MOL, P77
[5]   INITIATION OF SWITCHING IN VO2 COPLANAR DEVICES [J].
DUCHENE, JC ;
TERRAILLON, MM ;
PAILLY, M ;
ADAM, GB .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1971, ED18 (12) :1151-+
[6]  
EFROS AL, 1967, FIZ TVERD TELA+, V9, P901
[7]   CONDUCTION BY SMALL POLARONS IN LARGE ELECTRIC FIELDS [J].
EMTAGE, PR .
PHYSICAL REVIEW B-SOLID STATE, 1971, 3 (08) :2685-&
[8]   SWITCHING PROPERTIES OF THIN NIO FILMS [J].
GIBBONS, JF ;
BEADLE, WE .
SOLID-STATE ELECTRONICS, 1964, 7 (11) :785-&
[9]  
HED AZ, 1968, J NONCRYST SOLIDS, V11, P535
[10]  
HERRELL DJ, 1972, 4 P INT C AM LIQ SEM, P449