CALCULATION OF MICROWAVE PERFORMANCE OF BUFFER LAYER GATE GAAS MESFET

被引:17
作者
NAGASHIMA, A
UMEBACHI, S
KANO, G
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D O I
10.1109/T-ED.1978.19123
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:537 / 539
页数:3
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共 8 条
[1]   DYNAMIC PERFORMANCE OF SCHOTTKY-BARRIER FIELD-EFFECT TRANSISTORS [J].
DRANGEID, KE ;
SOMMERHA.R .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1970, 14 (02) :82-&
[2]   GENERAL THEORY FOR PINCHED OPERATION OF JUNCTION-GATE FET [J].
GREBENE, AB ;
GHANDHI, SK .
SOLID-STATE ELECTRONICS, 1969, 12 (07) :573-+
[3]   VOLGATE-CURRENT CHARACTERISTICS OF GAAS J-FETS IN HOT ELECTRON RANGE [J].
LEHOVEC, K ;
ZULEEG, R .
SOLID-STATE ELECTRONICS, 1970, 13 (10) :1415-&
[4]  
MACKSEY HM, 1976, ELECTRON LETT, V12, P193
[5]   SEMI-INSULATED GATE GALLIUM-ARSENIDE FIELD-EFFECT TRANSISTOR [J].
PRUNIAUX, BR ;
NORTH, JC ;
PAYER, AV .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1972, ED19 (05) :672-&
[6]   NOISE CHARACTERISTICS OF GALLIUM-ARSENIDE FIELD-EFFECT TRANSISTORS [J].
STATZ, H ;
HAUS, HA ;
PUCEL, RA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (09) :549-562
[7]   AVALANCHE BREAKDOWN VOLTAGES OF ABRUPT AND LINEARLY GRADED P-N JUNCTIONS IN GE SI GAAS AND GAP - (DOPANT EFFECTS IMPURITY EFFECTS T) [J].
SZE, SM ;
GIBBONS, G .
APPLIED PHYSICS LETTERS, 1966, 8 (05) :111-&