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CALCULATION OF MICROWAVE PERFORMANCE OF BUFFER LAYER GATE GAAS MESFET
被引:17
作者
:
NAGASHIMA, A
论文数:
0
引用数:
0
h-index:
0
NAGASHIMA, A
UMEBACHI, S
论文数:
0
引用数:
0
h-index:
0
UMEBACHI, S
KANO, G
论文数:
0
引用数:
0
h-index:
0
KANO, G
机构
:
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1978年
/ 25卷
/ 05期
关键词
:
D O I
:
10.1109/T-ED.1978.19123
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:537 / 539
页数:3
相关论文
共 8 条
[1]
DYNAMIC PERFORMANCE OF SCHOTTKY-BARRIER FIELD-EFFECT TRANSISTORS
[J].
DRANGEID, KE
论文数:
0
引用数:
0
h-index:
0
DRANGEID, KE
;
SOMMERHA.R
论文数:
0
引用数:
0
h-index:
0
SOMMERHA.R
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
:82
-&
[2]
GENERAL THEORY FOR PINCHED OPERATION OF JUNCTION-GATE FET
[J].
GREBENE, AB
论文数:
0
引用数:
0
h-index:
0
机构:
Signetics Corporation, Research and Development Labs., Sunnyvale, CA
GREBENE, AB
;
GHANDHI, SK
论文数:
0
引用数:
0
h-index:
0
机构:
Signetics Corporation, Research and Development Labs., Sunnyvale, CA
GHANDHI, SK
.
SOLID-STATE ELECTRONICS,
1969,
12
(07)
:573
-+
[3]
VOLGATE-CURRENT CHARACTERISTICS OF GAAS J-FETS IN HOT ELECTRON RANGE
[J].
LEHOVEC, K
论文数:
0
引用数:
0
h-index:
0
LEHOVEC, K
;
ZULEEG, R
论文数:
0
引用数:
0
h-index:
0
ZULEEG, R
.
SOLID-STATE ELECTRONICS,
1970,
13
(10)
:1415
-&
[4]
MACKSEY HM, 1976, ELECTRON LETT, V12, P193
[5]
SEMI-INSULATED GATE GALLIUM-ARSENIDE FIELD-EFFECT TRANSISTOR
[J].
PRUNIAUX, BR
论文数:
0
引用数:
0
h-index:
0
PRUNIAUX, BR
;
NORTH, JC
论文数:
0
引用数:
0
h-index:
0
NORTH, JC
;
PAYER, AV
论文数:
0
引用数:
0
h-index:
0
PAYER, AV
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(05)
:672
-&
[6]
NOISE CHARACTERISTICS OF GALLIUM-ARSENIDE FIELD-EFFECT TRANSISTORS
[J].
STATZ, H
论文数:
0
引用数:
0
h-index:
0
机构:
RAYTHEON CO, RES DIV, MICROWAVE SEMICOND DEVICES PROGRAM, WALTHAM, MA 02154 USA
STATZ, H
;
HAUS, HA
论文数:
0
引用数:
0
h-index:
0
机构:
RAYTHEON CO, RES DIV, MICROWAVE SEMICOND DEVICES PROGRAM, WALTHAM, MA 02154 USA
HAUS, HA
;
PUCEL, RA
论文数:
0
引用数:
0
h-index:
0
机构:
RAYTHEON CO, RES DIV, MICROWAVE SEMICOND DEVICES PROGRAM, WALTHAM, MA 02154 USA
PUCEL, RA
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1974,
ED21
(09)
:549
-562
[7]
AVALANCHE BREAKDOWN VOLTAGES OF ABRUPT AND LINEARLY GRADED P-N JUNCTIONS IN GE SI GAAS AND GAP - (DOPANT EFFECTS IMPURITY EFFECTS T)
[J].
SZE, SM
论文数:
0
引用数:
0
h-index:
0
SZE, SM
;
GIBBONS, G
论文数:
0
引用数:
0
h-index:
0
GIBBONS, G
.
APPLIED PHYSICS LETTERS,
1966,
8
(05)
:111
-&
[8]
MICROWAVE PROPERTIES OF SCHOTTKY-BARRIER FIELD-EFFECT TRANSISTORS
[J].
WOLF, P
论文数:
0
引用数:
0
h-index:
0
WOLF, P
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
:125
-+
←
1
→
共 8 条
[1]
DYNAMIC PERFORMANCE OF SCHOTTKY-BARRIER FIELD-EFFECT TRANSISTORS
[J].
DRANGEID, KE
论文数:
0
引用数:
0
h-index:
0
DRANGEID, KE
;
SOMMERHA.R
论文数:
0
引用数:
0
h-index:
0
SOMMERHA.R
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
:82
-&
[2]
GENERAL THEORY FOR PINCHED OPERATION OF JUNCTION-GATE FET
[J].
GREBENE, AB
论文数:
0
引用数:
0
h-index:
0
机构:
Signetics Corporation, Research and Development Labs., Sunnyvale, CA
GREBENE, AB
;
GHANDHI, SK
论文数:
0
引用数:
0
h-index:
0
机构:
Signetics Corporation, Research and Development Labs., Sunnyvale, CA
GHANDHI, SK
.
SOLID-STATE ELECTRONICS,
1969,
12
(07)
:573
-+
[3]
VOLGATE-CURRENT CHARACTERISTICS OF GAAS J-FETS IN HOT ELECTRON RANGE
[J].
LEHOVEC, K
论文数:
0
引用数:
0
h-index:
0
LEHOVEC, K
;
ZULEEG, R
论文数:
0
引用数:
0
h-index:
0
ZULEEG, R
.
SOLID-STATE ELECTRONICS,
1970,
13
(10)
:1415
-&
[4]
MACKSEY HM, 1976, ELECTRON LETT, V12, P193
[5]
SEMI-INSULATED GATE GALLIUM-ARSENIDE FIELD-EFFECT TRANSISTOR
[J].
PRUNIAUX, BR
论文数:
0
引用数:
0
h-index:
0
PRUNIAUX, BR
;
NORTH, JC
论文数:
0
引用数:
0
h-index:
0
NORTH, JC
;
PAYER, AV
论文数:
0
引用数:
0
h-index:
0
PAYER, AV
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(05)
:672
-&
[6]
NOISE CHARACTERISTICS OF GALLIUM-ARSENIDE FIELD-EFFECT TRANSISTORS
[J].
STATZ, H
论文数:
0
引用数:
0
h-index:
0
机构:
RAYTHEON CO, RES DIV, MICROWAVE SEMICOND DEVICES PROGRAM, WALTHAM, MA 02154 USA
STATZ, H
;
HAUS, HA
论文数:
0
引用数:
0
h-index:
0
机构:
RAYTHEON CO, RES DIV, MICROWAVE SEMICOND DEVICES PROGRAM, WALTHAM, MA 02154 USA
HAUS, HA
;
PUCEL, RA
论文数:
0
引用数:
0
h-index:
0
机构:
RAYTHEON CO, RES DIV, MICROWAVE SEMICOND DEVICES PROGRAM, WALTHAM, MA 02154 USA
PUCEL, RA
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1974,
ED21
(09)
:549
-562
[7]
AVALANCHE BREAKDOWN VOLTAGES OF ABRUPT AND LINEARLY GRADED P-N JUNCTIONS IN GE SI GAAS AND GAP - (DOPANT EFFECTS IMPURITY EFFECTS T)
[J].
SZE, SM
论文数:
0
引用数:
0
h-index:
0
SZE, SM
;
GIBBONS, G
论文数:
0
引用数:
0
h-index:
0
GIBBONS, G
.
APPLIED PHYSICS LETTERS,
1966,
8
(05)
:111
-&
[8]
MICROWAVE PROPERTIES OF SCHOTTKY-BARRIER FIELD-EFFECT TRANSISTORS
[J].
WOLF, P
论文数:
0
引用数:
0
h-index:
0
WOLF, P
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1970,
14
(02)
:125
-+
←
1
→