REFRACTIVE-INDEX OF LIF FILMS AS A FUNCTION OF TIME

被引：8

作者：

HALTOM, TL

ARAKAWA, ET

WILLIAMS, MW

KRETSCHMANN, E

机构：

[1] Oak Ridge National Laboratory, Health and Safety Research Division, Oak Ridge, TN

[2] Hamburg 6, Schaeferstr.28

[3] Millsaps College, Jackson, MS

来源：

APPLIED OPTICS | 1979年 / 18卷 / 08期

关键词：

D O I：

10.1364/AO.18.001233

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The optical properties and thickness of evaporated LiF films on silver or aluminum were determined by attenuated total reflection techniques as a function of time after deposition.With the LiF films maintained in vacuum, the refractive index increased from ˜1.3 to ˜1.4, or close to the crystalline value, in the course of a few days.This implies that the LiF, loosely packed when first deposited, anneals over a period of time to the more closely packed crystalline configuration.The LiF films were found to be optically isotropic in contrast to earlier reports of anisotropy.© 1979 Optical Society of America.

引用

页码：1233 / 1236

页数：4

共 7 条

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[2] Hornauer D., 1973, Optics Communications, V7, P297, DOI 10.1016/0030-4018(73)90037-0
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KRETSCHM.E
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[4] KRETSCHMANN ED, 1977, B AM PHYS SOC, V22, P1269
[5] Otto A., 1971, Optics Communications, V3, P254, DOI 10.1016/0030-4018(71)90017-4
[6] OTTO A, 1976, OPTICAL PROPERTIES S, P677
[7] HILLOCK FORMATION BY SURFACE DIFFUSION ON THIN SILVER FILMS
PRESLAND, AE
PRICE, GL
TRIMM, DL
[J]. SURFACE SCIENCE, 1972, 29 (02) : 424 - &

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