THE DETERMINATION OF THE ELASTIC CONSTANTS OF SILICON BY DIFFUSE XRAY REFLEXIONS

被引：12

作者：

PRASAD, SC

WOOSTER, WA

机构：

来源：

ACTA CRYSTALLOGRAPHICA | 1955年 / 8卷 / 06期

关键词：

D O I：

10.1107/S0365110X55001163

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：361 / 361

页数：1

相关论文

共 5 条

[1]

Bridgman P.W., 1949, P AM ACAD ARTS SCI, V77, P189

[2] MEASUREMENT OF THE ELASTIC CONSTANTS OF SILICON SINGLE CRYSTALS AND THEIR THERMAL COEFFICIENTS [J].

MCSKIMIN, HJ ;

BOND, WL ;

BUEHLER, E ;

TEAL, GK .

PHYSICAL REVIEW, 1951, 83 (05) :1080-1080

[3] MEASUREMENT OF ELASTIC CONSTANTS AT LOW TEMPERATURES BY MEANS OF ULTRASONIC WAVES - DATA FOR SILICON AND GERMANIUM SINGLE CRYSTALS, AND FOR FUSED SILICA [J].

MCSKIMIN, HJ .

JOURNAL OF APPLIED PHYSICS, 1953, 24 (08) :988-997

[4] DETERMINATION OF ELASTIC CONSTANTS OF CRYSTALS FROM DIFFUSE REFLEXIONS OF X-RAYS .1. THEORY OF METHOD [J].

RAMACHANDRAN, GN ;

WOOSTER, WA .

ACTA CRYSTALLOGRAPHICA, 1951, 4 (04) :335-344

[5] DETERMINATION OF ELASTIC CONSTANTS OF CRYSTALS FROM DIFFUSE REFLEXIONS OF X-RAYS .2. APPLICATION TO SOME CUBIC CRYSTALS [J].

RAMACHANDRAN, GN ;

WOOSTER, WA .

ACTA CRYSTALLOGRAPHICA, 1951, 4 (05) :431-440