CHARACTERIZATION OF SPINEL-TYPE COBALT AND NICKEL-OXIDE THIN-FILMS BY X-RAY NEAR GRAZING DIFFRACTION, TRANSMISSION AND REFLECTANCE SPECTROSCOPIES, AND CYCLIC VOLTAMMETRY

被引：96

作者：

NKENG, P ^{[1
]}

POILLERAT, G ^{[1
]}

KOENIG, JF ^{[1
]}

CHARTIER, P ^{[1
]}

LEFEZ, B ^{[1
]}

LOPITAUX, J ^{[1
]}

LENGLET, M ^{[1
]}

机构：

[1] UNIV ROUEN,PHYSIOCHIM & CHIM MAT LAB,F-76131 MONT ST AIGNAN,FRANCE

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1995年 / 142卷 / 06期

关键词：

D O I：

10.1149/1.2044193

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The application of three analytical techniques, x-ray near grazing diffraction, infrared transmission and reflectance spectroscopy, and W-visible-near-infrared reflectance spectroscopy, to the characterization of cobalt cobaltite, Co3O4, and of nickel cobaltite, NiCo2O4 films, is reported. Thin films of Co3O4 and NiCo2O4, in a 10-1000 nm thickness range were prepared by two methods: spraying and sputtering. Characteristic spectra and thickness limits are discussed based on theoretical considerations. Corresponding cyclic voltammograms are presented and discussed. Among the four methods of investigation of the cationic composition of the films, cyclic voltammetry appears to be the least sensitive.

引用

页码：1777 / 1783

页数：7

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