QUANTITATIVE X-RAY PHOTOELECTRON-SPECTROSCOPY ANALYSIS OF ALKALI IONS ZIRCONIA SYSTEMS

Zirconia-supported alkali ions, containing Na, from 0.74 to 3.61 wt.%, and K, from 0.91 to 4.76 wt.%, have been studied by X-Ray Photoelectron Spectroscopy, X-ray diffraction and chemical analyses. The results show that the alkali ions remain dispersed on the zirconia surface. After treatment at 773 K in air, 5h, the Na containing samples maintain a good dispersion at low Na content, whereas for the more concentrated samples, agglomeration and incorporation in solid solution have been detected. The K based system shows neither agglomeration nor incorporation in solid solution of potassium ions. The XPS intensity ratios are compared with calculated values, according to different models, to account for the changes in surface morphology.