SUPERCONDUCTING AND STRUCTURAL CHARACTERISTICS OF YBA2CU3O7-X THIN-FILMS ON SI(001) SUBSTRATES WITH YSZ BUFFER LAYERS

被引：1

作者：

PRIETO, P

GOMEZ, ME

CHACON, M

MORAN, O

OYOLA, D

机构：

[1] Depto de Fisica, Universidad del Valle, Cali

来源：

APPLIED SUPERCONDUCTIVITY | 1994年 / 2卷 / 01期

关键词：

D O I：

10.1016/0964-1807(94)90049-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have prepared high quality c-axis oriented superconducting YBa2Cu3O7-x thin films on Si(001) substrates covered with YSZ = (ZrO2 + 10 at.% Y2O3) layers by an in situ high pressure (3-5 mbar) oxygen d.c./r.f. sputtering process at substrate temperatures of about 750 degrees C. The films were characterized by X-ray diffraction, transmission electron microscopy (TEM) and electron scanning (SEM) techniques. A superconducting transition temperature Tc(R similar or equal to 0)= 89 K was determined by resistivity and susceptibility measurements. Cross sectional TEM analysis showed a sharp interface between YSZ and Si;however an inter diffusion zone was observed between YSZ and YBa2Cu3O7-x layers.

引用

页码：17 / 20

页数：4

共 8 条

[1]

EIBL O, 1989, 4TH P EMSA M, P172

[2]

FORK D, 1990, IEEE T APPL SUPERCON, V1, P67

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