GAIN FATIGUE MECHANISM IN CHANNEL ELECTRON MULTIPLIERS

[1] ADAMS J, 1965, ELECTRON ENG, V37, P180

[2] MECHANISM OF CHANNEL ELECTRON MULTIPLICATION [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1966, NS13 (03) : 88 - +

[3] A THEORY OF SECONDARY ELECTRON EMISSION FROM METALS [J]. PHYSICAL REVIEW, 1950, 78 (06): : 780 - 787

[4] CHUIKO GA, 1964, IZV AN SSSR FIZ, V28, P1415

[5] THE POSSIBLE OCCURRENCE OF EXCITON-ENHANCED SECONDARY EMISSION [J]. PHYSICA, 1956, 22 (05): : 361 - 366

[6] CHANNELTRON FATIGUE AND EFFICIENCY FOR PROTONS AND ELECTRONS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (01) : 88 - +

[7] Farnsworth P.T., 1930, US Patent, Patent No. [1,969,399, 1969399]

[8] Television by electron image scanning [J]. JOURNAL OF THE FRANKLIN INSTITUTE, 1934, 218 : 411 - 444

[9] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &

[10] INTERACTION OF SLOW ELECTRONS WITH CHEMISORBED OXYGEN [J]. CANADIAN JOURNAL OF PHYSICS, 1964, 42 (05) : 886 - &

[1] ADAMS J, 1965, ELECTRON ENG, V37, P180

[2] MECHANISM OF CHANNEL ELECTRON MULTIPLICATION [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1966, NS13 (03) : 88 - +

[3] A THEORY OF SECONDARY ELECTRON EMISSION FROM METALS [J]. PHYSICAL REVIEW, 1950, 78 (06): : 780 - 787

[4] CHUIKO GA, 1964, IZV AN SSSR FIZ, V28, P1415

[5] THE POSSIBLE OCCURRENCE OF EXCITON-ENHANCED SECONDARY EMISSION [J]. PHYSICA, 1956, 22 (05): : 361 - 366

[6] CHANNELTRON FATIGUE AND EFFICIENCY FOR PROTONS AND ELECTRONS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (01) : 88 - +

[7] Farnsworth P.T., 1930, US Patent, Patent No. [1,969,399, 1969399]

[8] Television by electron image scanning [J]. JOURNAL OF THE FRANKLIN INSTITUTE, 1934, 218 : 411 - 444

[9] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &

[10] INTERACTION OF SLOW ELECTRONS WITH CHEMISORBED OXYGEN [J]. CANADIAN JOURNAL OF PHYSICS, 1964, 42 (05) : 886 - &