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4160-BIT C4D SERIAL MEMORY
被引:5
作者
:
KRAMBECK, RH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
KRAMBECK, RH
[
1
]
RETAJCZYK, TF
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
RETAJCZYK, TF
[
1
]
SILVERSMITH, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
SILVERSMITH, DJ
[
1
]
STRAIN, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
STRAIN, RJ
[
1
]
机构
:
[1]
BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
来源
:
IEEE JOURNAL OF SOLID-STATE CIRCUITS
|
1974年
/ SC 9卷
/ 06期
关键词
:
D O I
:
10.1109/JSSC.1974.1050539
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:436 / 443
页数:8
相关论文
共 6 条
[1]
CHARGE COUPLED SEMICONDUCTOR DEVICES
[J].
BOYLE, WS
论文数:
0
引用数:
0
h-index:
0
BOYLE, WS
;
SMITH, GE
论文数:
0
引用数:
0
h-index:
0
SMITH, GE
.
BELL SYSTEM TECHNICAL JOURNAL,
1970,
49
(04)
:587
-+
[2]
KARP JA, 1972 INT SOL STAT CI
[3]
CONDUCTIVELY CONNECTED CHARGE-COUPLED DEVICE
[J].
KRAMBECK, RH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
KRAMBECK, RH
;
STRAIN, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
STRAIN, RJ
;
SMITH, GE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
SMITH, GE
;
PICKAR, KA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
PICKAR, KA
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1974,
ED21
(01)
:70
-72
[4]
NUMERICAL-CALCULATION OF IMPURITY REDISTRIBUTION DURING THERMAL OXIDATION OF SEMICONDUCTORS
[J].
KRAMBECK, RH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
KRAMBECK, RH
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(04)
:588
-591
[5]
DOPED SURFACE 2-PHASE CCD
[J].
KRAMBECK, RH
论文数:
0
引用数:
0
h-index:
0
KRAMBECK, RH
;
WALDEN, RH
论文数:
0
引用数:
0
h-index:
0
WALDEN, RH
;
PICKAR, KA
论文数:
0
引用数:
0
h-index:
0
PICKAR, KA
.
BELL SYSTEM TECHNICAL JOURNAL,
1972,
51
(08)
:1849
-+
[6]
SZE SM, 1969, PHYSICS SEMICONDUCTO, P115
←
1
→
共 6 条
[1]
CHARGE COUPLED SEMICONDUCTOR DEVICES
[J].
BOYLE, WS
论文数:
0
引用数:
0
h-index:
0
BOYLE, WS
;
SMITH, GE
论文数:
0
引用数:
0
h-index:
0
SMITH, GE
.
BELL SYSTEM TECHNICAL JOURNAL,
1970,
49
(04)
:587
-+
[2]
KARP JA, 1972 INT SOL STAT CI
[3]
CONDUCTIVELY CONNECTED CHARGE-COUPLED DEVICE
[J].
KRAMBECK, RH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
KRAMBECK, RH
;
STRAIN, RJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
STRAIN, RJ
;
SMITH, GE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
SMITH, GE
;
PICKAR, KA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
PICKAR, KA
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1974,
ED21
(01)
:70
-72
[4]
NUMERICAL-CALCULATION OF IMPURITY REDISTRIBUTION DURING THERMAL OXIDATION OF SEMICONDUCTORS
[J].
KRAMBECK, RH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
KRAMBECK, RH
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(04)
:588
-591
[5]
DOPED SURFACE 2-PHASE CCD
[J].
KRAMBECK, RH
论文数:
0
引用数:
0
h-index:
0
KRAMBECK, RH
;
WALDEN, RH
论文数:
0
引用数:
0
h-index:
0
WALDEN, RH
;
PICKAR, KA
论文数:
0
引用数:
0
h-index:
0
PICKAR, KA
.
BELL SYSTEM TECHNICAL JOURNAL,
1972,
51
(08)
:1849
-+
[6]
SZE SM, 1969, PHYSICS SEMICONDUCTO, P115
←
1
→