4160-BIT C4D SERIAL MEMORY

被引:5
作者
KRAMBECK, RH [1 ]
RETAJCZYK, TF [1 ]
SILVERSMITH, DJ [1 ]
STRAIN, RJ [1 ]
机构
[1] BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
关键词
D O I
10.1109/JSSC.1974.1050539
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:436 / 443
页数:8
相关论文
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KARP JA, 1972 INT SOL STAT CI
[3]   CONDUCTIVELY CONNECTED CHARGE-COUPLED DEVICE [J].
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STRAIN, RJ ;
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IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (01) :70-72
[4]   NUMERICAL-CALCULATION OF IMPURITY REDISTRIBUTION DURING THERMAL OXIDATION OF SEMICONDUCTORS [J].
KRAMBECK, RH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1974, 121 (04) :588-591
[5]   DOPED SURFACE 2-PHASE CCD [J].
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BELL SYSTEM TECHNICAL JOURNAL, 1972, 51 (08) :1849-+
[6]  
SZE SM, 1969, PHYSICS SEMICONDUCTO, P115