GROWTH OF C-AXIS ORIENTED YBACUO FILMS ON OXIDIZED TEXTURED NI SHEETS AND ON (100) AND (110) ORIENTED NIO SINGLE-CRYSTALS

被引:24
作者
GINSBACH, A
SCHNEIDER, R
GRUENINGER, HW
GRABE, G
机构
[1] Daimler-Benz Research Institute
关键词
D O I
10.1109/20.133449
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
YBaCuO films were grown on oxidized textured Ni sheets and on (100) and (110) oriented NiO single crystals by magnetron sputter deposition from a stoichiometric tubular target. The properties of the YBaCuO films are investigated as function of various preparation parameters (oxidation procedure of the sheets, substrate temperature T(s), HTSC film thickness). At T(s) = 780-degrees-C and for film thickness larger than 200 nm, the films have T(c) values around 80 K. The textures of the Ni sheets, NiO layers and YBaCuO films are determined using X-ray diffraction in Bragg-Brentano geometry and scanning electron microscopy. It is remarkable, that on textured oxidized Ni the YBaCuO films grow c-axis oriented. For comparison, the properties of films on differently oriented NiO single crystals are investigated. It is found that the film properties are better on (100) than on (110) surfaces.
引用
收藏
页码:1410 / 1413
页数:4
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