COMPUTER-PROGRAMS FOR THE CORRECTION OF MATRIX EFFECTS IN THE XRF ANALYSIS OF GLASS, CERAMICS AND RELATED SILICATE SYSTEMS

被引：5

作者：

COX, GA ^{[1
]}

POLLARD, AM ^{[1
]}

机构：

[1] UNIV OXFORD,ARCHAEOL HIST ART RES LAB,OXFORD,ENGLAND

来源：

关键词：

D O I：

10.1016/0305-4403(81)90021-2

中图分类号：

Q98 [人类学];

学科分类号：

030303 ;

摘要：

引用

页码：121 / 131

页数：11

共 13 条

[1]

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[2]

Bertin E.P., 1970, PRINCIPLES PRACTICE, P425

[3]

BIRKS LS, 1971, ELECTRON PROBE MICRO, P147

COX, GA ;

POLLARD, AM .

CRISS, JW ;

BIRKS, LS .

[6]

HANSON VF, 1978, PRACTICAL SPECTROSCO, V2, P413

HOLLAND, JG ;

BRINDLE, DW .

SPECTROCHIMICA ACTA, 1966, 22 (12) :2083-&

[8]

JENKINS R, 1976, ADV XRAY ANAL, V19, P1

[9]

JENKINS R, 1974, INTRO XRAY SPECTROME, P128

[10]

JENKINS R, 1970, PRACTICAL XRAY SPECT, P22