THE CHROMATIC IMAGE SHIFT IN SPATIALLY-RESOLVED EELS

被引：7

作者：

SCHATTSCHNEIDER, P ^{[1
]}

JOUFFREY, B ^{[1
]}

TISCHLER, C ^{[1
]}

BANGERT, H ^{[1
]}

机构：

[1] VIENNA TECH UNIV,INST ANGEW & TECH PHYS,A-1040 VIENNA,AUSTRIA

来源：

ULTRAMICROSCOPY | 1994年 / 53卷 / 03期

关键词：

D O I：

10.1016/0304-3991(94)90033-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A previously unnoticed effect that occurs in microanalysis by electron energy-loss spectrometry (EELS) in image mode has been investigated, namely the shift of the inelastic image relative to the elastic one. A method is proposed for correction of the shift in the microscope. It is shown by way of example that quantitative microanalysis with a sensitivity limit corresponding to nanometer-sized precipitates is possible, with full visual control of the area, when a parametric model for the spatial distribution of elements in the specimen can be defined.

引用

页码：181 / 190

页数：10

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