NOISE IN (DOUBLE) RELAXATION OSCILLATION SQUIDS

被引：3

作者：

ADELERHOF, DJ

FLOKSTRA, J

ROGALLA, H

机构：

[1] Department of Applied Physics, University of Twente, 7500 AE Enschede

来源：

PHYSICA B | 1994年 / 194卷 / pt 1期

关键词：

Critical current noise - Flux noise spectral density - Flux to voltage transfer - Relaxation oscillations - Superconducting quantum interference devices - Thermal fluctuations;

D O I：

10.1016/0921-4526(94)90400-6

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We have modelled the effect of two intrinsic noise sources on the flux noise spectral density of (Double) Relaxation Oscillation SQUIDs ((D)ROSs) based on hysteretic Josephson tunnel junctions. An important noise source is the spread in the critical current of the SQUID due to thermal fluctuations. Critical current noise mainly determines the noise on the average output voltage of DROSs with high flux to voltage transfer. A second noise source is the spread in the relaxation frequency due to the random interaction between the Josephson oscillations and the relaxation oscillations during switching to the zero-voltage state. This effect can dominate the voltage noise of a ROS.

引用

页码：141 / 142

页数：2