ANALYSIS OF VALENCE SHELL ELECTRONIC EXCITATIONS IN SILICON AND ITS REFRACTORY COMPOUNDS USING ELECTRON-ENERGY LOSS MICROSPECTROSCOPY

被引：12

作者：

SKIFF, WM

CARPENTER, RW

LIN, SH

机构：

来源：

关键词：

D O I：

10.1063/1.342094

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：6328 / 6335

页数：8

共 30 条

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