ELLIPTIC MULTILAYER BRAGG-FRESNEL LENSES WITH SUBMICRON SPATIAL-RESOLUTION FOR X-RAYS

被引：45

作者：

ERKO, A

AGAFONOV, Y

PANCHENKO, LA

YAKSHIN, A

CHEVALLIER, P

DHEZ, P

LEGRAND, F

机构：

[1] UNIV PARIS 11,UTILISAT RAYONEMENT ELECTROMAGNET LAB,F-91405 ORSAY,FRANCE

[2] UNIV PARIS 11,SPECTROSCOPIE ATOM & ION LAB,F-91405 ORSAY,FRANCE

[3] UNIV PARIS 06,PHYS ATOM & NUCL LAB,F-75252 PARIS,FRANCE

来源：

OPTICS COMMUNICATIONS | 1994年 / 106卷 / 4-6期

关键词：

D O I：

10.1016/0030-4018(94)90311-5

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Elliptical Bragg-Fresnel multilayer lenses (BFML), designed and fabricated at the Institute of Microelectronic Technology (Russian Academy of Science) have been used for two-dimensional focusing of the white X-ray synchrotron beam at LURE (Orsay France). For two fixed beam energies (8 keV and 12.4 keV), the spot size produced was approximately 1 mum as determined from a high resolution photographic plate. A fluorescence X-ray scanning microprobe based on these BFML lenses was also tested. The transmitted signal registered during the scan of a test object shows less than 1 mum resolution with 8 keV output photon energy. 2D scanning images with submicron resolution of test objects in transmission mode at 8 keV and 12.4 keV beam energies are presented.

引用

页码：146 / 150

页数：5

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