THE EPITAXIAL-GROWTH OF ALGAAS USING HIGH PURIFIED TRIMETHYLALUMINUM

被引:3
作者
MAEDA, T [1 ]
HATA, M [1 ]
ISEMURA, M [1 ]
YAKO, T [1 ]
机构
[1] SUMITOMO CHEM CO LTD,EHIME RES LAB,TAKATSUKI,OSAKA 569,JAPAN
关键词
OMPVE; EPITAXY; ALGAAS; SOURCE GAS; TRIMETHYLALUMINUM; IMPURITY; PURIFICATION; HEMT;
D O I
10.1002/aoc.590050416
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
Highly purified trimethylaluminum [(CH3)3Al] was prepared by reducing the contamination of volatile impurities such as organic silicon and dimethyl-aluminum methoxide [(CH3)2AlOCH3]. The concentration of methoxy group in (CH3)3Al was found to decrease considerably when (CH3)3Al was distilled in the presence of aluminum trihalide. Among the halides, purification efficiency increased in the order I > Br > Cl. High-quality AlGaAs layer and AlGaAs/GaAs modulation doped structures were grown by organometallic vapor-phase epiloxy (OMVPE) using the purified (CH3)3Al. Their electrical properties were discussed in relation to the volatile impurity in the source gas.
引用
收藏
页码:319 / 323
页数:5
相关论文
共 9 条
[1]   RESIDUAL IMPURITIES IN EPITAXIAL LAYERS GROWN BY MOVPE [J].
HATA, M ;
FUKUHARA, N ;
ZEMPO, Y ;
ISEMURA, M ;
YAKO, T ;
MAEDA, T .
JOURNAL OF CRYSTAL GROWTH, 1988, 93 (1-4) :543-549
[2]  
KEUCH TF, 1986, J CRYST GROWTH, V77, P257
[3]  
LUNDEEN AJ, 1966, Patent No. 3290349
[5]  
Mole T, 1972, ORGANOALUMINIUM COMP, P205
[6]  
Stringfellow G.B., 1981, J CRYST GROWTH, V53, P42
[7]   DETERMINATION OF TRACE-ELEMENTS IN TRIMETHYLGALLIUM BY ELECTROTHERMAL ATOMIZATION ATOMIC-ABSORPTION SPECTROMETRY AND INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION-SPECTROMETRY [J].
TAKEDA, K ;
MINOBE, M ;
HOSHIKA, T ;
JINNO, T ;
YAKO, T .
ANALYST, 1990, 115 (05) :535-538
[8]   EFFECTS OF OXYGEN AND WATER-VAPOR INTRODUCTION DURING MOCVD GROWTH OF GAALAS [J].
TERAO, H ;
SUNAKAWA, H .
JOURNAL OF CRYSTAL GROWTH, 1984, 68 (01) :157-162
[9]  
1990, Patent No. 267230