CHARGE SCREENING LENGTH IN AMORPHOUS-CHALCOGENIDE SEMICONDUCTORS

被引：3

作者：

MARSHALL, JM

机构：

来源：

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1978年 / 38卷 / 04期

关键词：

D O I：

10.1080/13642817808245342

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：407 / 417

页数：11

共 13 条

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