OBSERVATION OF HIGH MOBILITY AND CYCLOTRON-RESONANCE IN 20-A SILICON DELTA-DOPED GAAS GROWN BY MBE AT 480-DEGREES-C

被引:64
作者
KOENRAAD, PM
BLOM, FAP
LANGERAK, CJGM
LEYS, MR
PERENBOOM, JAAJ
SINGLETON, J
SPERMON, SJRM
VANDERVLEUTEN, WC
VONCKEN, APJ
WOLTER, JH
机构
[1] Dept. of Phys., Eindhoven Univ. of Technol.
关键词
Cyclotron Resonance;
D O I
10.1088/0268-1242/5/8/010
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The authors report on temperature-dependent Hall effect measurements on Si delta-doped GaAs samples grown by MBE at 480°C, 530°C and 620°C. In the best sample grown at 480°C the mobility is 6760 cm2 V -1 s-1 at 4.2 K. To the authors' knowledge this is the highest mobility ever reported in a delta-doped structure. From subband population measurements the spreading of the donors in the samples grown at low temperature is determined to be 20 Å. On these high-mobility samples they were able to perform the first reported cyclotron resonance measurements. The electron effective mass is found to be considerably higher than that at the Gamma-conduction band minimum in GaAs.
引用
收藏
页码:861 / 866
页数:6
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