A STUDY ON THE RELATIONSHIP BETWEEN GROWTH TECHNIQUE AND DOPANTS ON THE ELECTRICAL-PROPERTIES OF GAAS WITH SPECIAL REFERENCE TO LEC GROWTH

被引:46
作者
MULLIN, JB
ROYLE, A
BENN, S
机构
关键词
D O I
10.1016/0022-0248(80)90006-8
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
引用
收藏
页码:625 / 637
页数:13
相关论文
共 45 条
[1]  
ASHEN DJ, 1974, P INT C GAAS RELATED, P229
[2]  
BASS SJ, 1966, P INT S GALLIUM ARSE, P41
[3]  
Brooks H., 1955, ADV ELECTRON, V7, P85
[4]   CARBON, OXYGEN AND SILICON IMPURITIES IN GALLIUM-ARSENIDE [J].
BROZEL, MR ;
CLEGG, JB ;
NEWMAN, RC .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1978, 11 (09) :1331-1339
[5]   THEORY OF IMPURITY SCATTERING IN SEMICONDUCTORS [J].
CONWELL, E ;
WEISSKOPF, VF .
PHYSICAL REVIEW, 1950, 77 (03) :388-390
[6]  
DINGLE RB, 1955, PHILOS MAG, V46, P831
[7]  
DOBSON PS, 1978, P INT S GAAS RELATED, P163
[8]   THE BEHAVIOUR OF SOME IMPURITIES IN III-V COMPOUNDS [J].
EDMOND, JT .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1959, 73 (472) :622-627
[9]   MOBILITY OF ELECTRONS IN COMPENSATED SEMICONDUCTORS .2. THEORY [J].
FALICOV, LM ;
CUEVAS, M .
PHYSICAL REVIEW, 1967, 164 (03) :1025-&
[10]  
GRABMAIER BC, 1972, J CRYST GROWTH, V13, P635