ELECTRONIC STATES OF ASYMMETRIC DIMERS AT THE SI(100)-(2 X-1) SURFACE IN ELECTRIC-FIELDS

被引:8
作者
WATANABE, K [1 ]
WATANABE, K [1 ]
机构
[1] TOKYO METROPOLITAN TECH COLL, SHINAGAWA KU, TOKYO 140, JAPAN
关键词
SURFACE ELECTRONIC STATES; ELECTRIC FIELDS; SILICON SURFACE; THEORY;
D O I
10.1143/JPSJ.61.419
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Electronic structures of Si(100)-(2 x 1) in electric fields are calculated by the self-consistent pseudopotential method. Assuming an asymmetric dimer model, we obtain a characteristic change in the charge distribution around the dimer due to applied fields of 0.6 V/angstrom-1.8 V/angstrom. It is found that the field of negative tip voltage repels the electron charge around an up atom of the dimer and pushes it to the inside of the bulk, reducing the charge imbalance of the asymmetric dimer. This result is consistent with the recent scanning tunneling microscope (STM) experiment, which analyzed the relation between the buckling of dimers and applied fields.
引用
收藏
页码:419 / 422
页数:4
相关论文
共 24 条
[1]   PROPOSAL FOR SYMMETRIC DIMERS AT THE SI(100)-2X1 SURFACE [J].
ARTACHO, E ;
YNDURAIN, F .
PHYSICAL REVIEW LETTERS, 1989, 62 (21) :2491-2494
[2]   PREDICTION OF THE EFFECT OF THE SAMPLE BIASING IN SCANNING TUNNELING MICROSCOPY AND OF SURFACE-DEFECTS ON THE OBSERVED CHARACTER OF THE DIMERS IN THE SI(001)-(2X1) SURFACE [J].
BADZIAG, P ;
VERWOERD, WS ;
VANHOVE, MA .
PHYSICAL REVIEW B, 1991, 43 (03) :2058-2062
[3]   ATOMIC-STRUCTURE OF THE SI(001)-(2X1) SURFACE [J].
BATRA, IP .
PHYSICAL REVIEW B, 1990, 41 (08) :5048-5054
[4]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[5]   ORDER AND STRUCTURE OF SEMICONDUCTOR SURFACES - AN ASSESSMENT WITH HE DIFFRACTION [J].
CARDILLO, MJ ;
LAMBERT, WR .
SURFACE SCIENCE, 1986, 168 (1-3) :724-733
[6]   POSITIONING SINGLE ATOMS WITH A SCANNING TUNNELING MICROSCOPE [J].
EIGLER, DM ;
SCHWEIZER, EK .
NATURE, 1990, 344 (6266) :524-526
[7]   STEPS ON SI(001) [J].
GRIFFITH, JE ;
KOCHANSKI, GP ;
KUBBY, JA ;
WIERENGA, PE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03) :1914-1918
[8]   SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE [J].
HAMERS, RJ ;
TROMP, RM ;
DEMUTH, JE .
PHYSICAL REVIEW LETTERS, 1986, 56 (18) :1972-1975
[9]   SCANNING TUNNELING MICROSCOPY OF SI(001) [J].
HAMERS, RJ ;
TROMP, RM ;
DEMUTH, JE .
PHYSICAL REVIEW B, 1986, 34 (08) :5343-5357
[10]   SURFACES OF SILICON [J].
HANEMAN, D .
REPORTS ON PROGRESS IN PHYSICS, 1987, 50 (08) :1045-1086