Extending miciroscopic examination of metals

被引：9

作者：

Keller, F ^{[1
]}

Geisler, AH ^{[1
]}

机构：

[1] Aluminum Co Amer, Aluminum Res Labs, Met Div, New Kinsington, PA USA

来源：

关键词：

D O I：

10.1063/1.1707373

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：696 / 704

页数：9

共 11 条

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[4]

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[5]

KELLER F, 1944, MET TECH, V11

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Stranski, IN .

[7]

MAHL H, 1940, METALLWIRTSCHAFT, V19, P488

[8]

MARTON C, 1943, J APPL PHYS, V14, P522

[9] Surface replicas for use in the electron microscope [J].

Schaefer, VJ ;

Harker, D .

[10]

von Borries B, 1940, KOLLOID Z, V90, P132