INELASTIC CHANGES IN SPECIMENS DURING OPERATION OF FIELD-ION MICROSCOPE

被引：12

作者：

LOBERG, B

机构：

来源：

PHILOSOPHICAL MAGAZINE | 1971年 / 24卷 / 189期

关键词：

D O I：

10.1080/14786437108217032

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：593 / &

共 17 条

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[5] CHARACTERIZATION OF STACKING FAULTS WITH FIELD-ION MICROSCOPE [J].

FORTES, MA .

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[6]

LOBERG B, 1969, ARK FYS, V39, P383

[7]

LOBERG B, 1968, ARK FYS, V37, P509

[8]

LOBERG B, 1970, ARK FYS, V40, P413

[9]

Loberg B., 1970, ARK FYS, V40, P513

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Muller E. W., 1960, ADV ELECTRON, V13, P83, DOI 10.1016/S0065-2539(08)60210-3