IMPLANTATION OF POLYMERS AT MEDIUM ION FLUENCES - A SPATIAL HETEROGENEITY OF RADIATION-DAMAGE DUE TO DOMINANT ELECTRONIC STOPPING

被引:15
作者
FINK, D
MULLER, M
SCHMOLDT, A
ZHOU, JK
CHADDERTON, LT
XU, XL
机构
[1] CSIRO,DEPT APPL PHYS,LINDFIELD,NSW 2070,AUSTRALIA
[2] AUSTRALIAN NATL UNIV,RES SCH PHYS SCI,CTR LASER PHYS,CANBERRA,ACT 2601,AUSTRALIA
[3] ACAD SINICA,SHANGHAI INST MET,ION BEAM LAB,SHANGHAI 200050,PEOPLES R CHINA
关键词
D O I
10.1016/0168-583X(92)95080-B
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
When low energy light ions are implanted into polymers it has been shown (1984) that at room temperature they have a final distribution in space which parallels that of the initial deposition of energy to the electrons. This suggests that such ions might be used as tracers in order to probe the detailed distribution of damage due to excited electrons. Experiments are described in which the full, three-dimensional, spatial redistribution of some such typical light ions were studied. Specifically due to application of a recently developed and modified tomographic reconstruction procedure. A 5 MeV Li6 ion beam was chosen in order both to optimise the tomographic evaluation procedure, and also to facilitate comparison with the results of other previous low energy ion implantations. It is assumed that transverse mobility of the implanted ions in the polymer is only achieved above a certain threshold of polymeric destruction, and that this most likely corresponds to achieving a certain excited-electron energy transfer turning-point, due to track overlap. In these experiments, and for these doses, the electronically damaged polymer zones around the ion trajectories are indeed expected to begin to overlap each other. However, a substantial undamaged volume of polymer between latent tracks still remains. Because of this the ion mobility parallel to the tracks still dominates, and broader three-dimensional ion distributions are therefore not observed.
引用
收藏
页码:432 / 437
页数:6
相关论文
共 19 条
[1]   A MONTE-CARLO COMPUTER-PROGRAM FOR THE TRANSPORT OF ENERGETIC IONS IN AMORPHOUS TARGETS [J].
BIERSACK, JP ;
HAGGMARK, LG .
NUCLEAR INSTRUMENTS & METHODS, 1980, 174 (1-2) :257-269
[2]   USE OF NEUTRON-INDUCED REACTIONS FOR LIGHT-ELEMENT PROFILING AND LATTICE LOCALIZATION [J].
BIERSACK, JP ;
FINK, D ;
HENKELMANN, R ;
MULLER, K .
NUCLEAR INSTRUMENTS & METHODS, 1978, 149 (1-3) :93-97
[3]   PRINCIPLES OF COMPUTER-ASSISTED TOMOGRAPHY (CAT) IN RADIOGRAPHIC AND RADIOISOTOPIC IMAGING [J].
BROOKS, RA ;
DICHIRO, G .
PHYSICS IN MEDICINE AND BIOLOGY, 1976, 21 (05) :689-732
[4]  
Chadderton L. T., 1971, Radiation Effects, V8, P77, DOI 10.1080/00337577108231012
[5]   DEPTH DISTRIBUTIONS OF MEGAELECTRONVOLT N-14 IMPLANTED INTO VARIOUS SOLIDS AT ELEVATED FLUENCES [J].
FINK, D ;
BIERSACK, JP ;
MULLER, M ;
WANG, LH ;
CHENG, VK ;
KASSING, R ;
MASSELI, K ;
WEISER, M ;
KALBITZER, S .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1989, 2 (1-3) :49-54
[6]   RECONSTRUCTION OF 3-DIMENSIONAL RANGE DISTRIBUTIONS BY A MODIFIED TOMOGRAPHIC TECHNIQUE [J].
FINK, D ;
MULLER, M ;
WANG, L .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (03) :958-964
[7]   NON-REGULAR DEPTH PROFILES OF LIGHT-IONS IMPLANTED INTO ORGANIC POLYMER-FILMS [J].
FINK, D ;
MULLER, M ;
STETTNER, U ;
BEHAR, M ;
FICHTNER, PFP ;
ZAWISLAK, FC ;
KOUL, S .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 32 (1-4) :150-154
[8]   OPTICALLY ABSORBING LAYERS ON ION-BEAM MODIFIED POLYMERS - A STUDY OF THEIR EVOLUTION AND PROPERTIES [J].
FINK, D ;
MULLER, M ;
CHADDERTON, LT ;
CANNINGTON, PH ;
ELLIMAN, RG ;
MCDONALD, DC .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 32 (1-4) :125-130
[9]   ION-BEAM INDUCED CARBON CLUSTERS IN POLYMERS [J].
FINK, D ;
IBEL, K ;
GOPPELT, P ;
BIERSACK, JP ;
WANG, L ;
BEHAR, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 46 (1-4) :342-346
[10]   BACKGROUND REDUCTION IN LIGHT-ELEMENT DEPTH PROFILING BY A COINCIDENCE TECHNIQUE [J].
FINK, D ;
BIERSACK, JP ;
STUMPFF, C ;
SCHLOSSER, S .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 15 (1-6) :740-743