KNIFE-EDGE SCANNING MEASUREMENTS OF SUBWAVELENGTH FOCUSED LIGHT-BEAMS

被引：119

作者：

FIRESTER, AH ^{[1
]}

HELLER, ME ^{[1
]}

SHENG, P ^{[1
]}

机构：

[1] RCA LABS, PRINCETON, NJ 08540 USA

来源：

关键词：

D O I：

10.1364/AO.16.001971

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1971 / 1974

页数：4

共 8 条

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[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1972, 5 (03): : 237 - &
[8] MEASUREMENT OF MU-M SIZED RADIUS OF GAUSSIAN LASER-BEAM USING SCANNING KNIFE-EDGE
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[J]. APPLIED OPTICS, 1975, 14 (12): : 2809 - 2810