COMPARISON BETWEEN THE PRECISION CHARACTERISTICS OF THE MAGNETIC AND ELECTROSTATIC PEAK SWITCHING SYSTEMS IN SECONDARY ION MASS-SPECTROMETRY

被引：12

作者：

ADRIAENS, A

ADAMS, F

机构：

[1] University of Antwerp, Department of Chemistry

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1991年 / 108卷 / 01期

关键词：

D O I：

10.1016/0168-1176(91)87005-L

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

Isotopic measurements for a number of elements have been carried out with a CAMECA IMS 4f secondary ion mass spectrometer. The mass selection through the instrument occurs either by changing the field strength of the magnet or by switching the electrostatic voltages. A comparison of the precision characteristics of both systems and an error analysis were made in this study.

引用

页码：41 / 52

页数：12

共 7 条

[1] [Anonymous], 1969, DATA REDUCTION ERROR
[2] Benninghoven A., 1987, SECONDARY ION MASS S, V86
[3] DAVIES OL, 1972, STATISTICAL METHODS
[4] TABLE OF THE ISOTOPIC COMPOSITION OF THE ELEMENTS AS DETERMINED BY MASS-SPECTROMETRY
DEBIEVRE, P
BARNES, IL
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1985, 65 (1-2): : 211 - 230
[5] ISOTOPE FRACTIONATION IN SECONDARY ION MASS-SPECTROMETRY
SHIMIZU, N
HART, SR
[J]. JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) : 1303 - 1311
[6] SLODZIAN G, 1983, SECONDARY ION MASS S, V4, P153
[7] WERNER HW, 1978, ELECTRON ION SPECTRO, P324

← 1 →