EPSILON-EXPANSION FOR INTERFACIAL PROFILE

被引：51

作者：

RUDNICK, J ^{[1
]}

JASNOW, D ^{[1
]}

机构：

[1] UNIV PITTSBURGH,DEPT PHYS & ASTRON,PITTSBURGH,PA 15260

来源：

PHYSICAL REVIEW B | 1978年 / 17卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.17.1351

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The profile for the diffuse interface separating two coexisting phases in a scalar (n=1) system is calculated to first order in ε=4-d. The lowest-order result is the renormalized Landau-Ginzburg expression. The O(ε) correction is small even at ε=1. A preliminary comparison with the experimental reflectivity measurements of Huang and Webb is made. Special difficulties involving the case d<̃3 are discussed. © 1978 The American Physical Society.

引用

页码：1351 / 1354

页数：4

共 16 条

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