WEAK-BEAM ALPHA-FRINGE ELECTRON-MICROSCOPY OF INTERFACE STRUCTURES

被引：11

作者：

MIYAZAWA, K ^{[1
]}

ISHIDA, Y ^{[1
]}

机构：

[1] UNIV TOKYO,INST IND SCI,TOKYO 106,JAPAN

来源：

关键词：

D O I：

10.1016/0304-3991(87)90067-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：231 / 238

页数：8

共 7 条

BACMANN, JJ ;

PAPON, AM ;

PETIT, M ;

SILVESTRE, G .

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[2]

HIRSCH PB, 1965, ELECTRON MICROSCOPY

ISHIDA, Y ;

MIYAZAWA, K ;

MORI, M .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1986, 53 (01) :131-140

[4]

ISHIDA Y, 1986, T JAPAN I METALS S, V27, P33

PAPON, AM ;

PETIT, M ;

BACMANN, JJ .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1984, 49 (04) :573-589

POND, RC ;

VITEK, V .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1977, 357 (1691) :453-&

[7]

SAITO H, IN PRESS